Journal of the Society of Motion Picture Engineers (1930-1949)

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534 SHAFER November diffraction pattern caused by the disturbance and the effect of the knife-edge in modifying this pattern. The Fraunhofer diffraction pattern can be calculated from (7) and (18). A sin kyA/f kyA/f A cos kyA if — •< cos <£ (asm ((kya/f) 1 ((%»//) (21) 2 .6 H — H r /6 i l-^rb — l^rt 0 0* OS IZ t — h (6 ~ mm. Fig. 8 — Fraunhofer diffraction pattern due to disturbance of Fig. 5. A = 10, a = 1, <f> = 0.125 X, / = 250 cm. Letters on the curves refer to the several terms of equation (21). The contribution of the disturbance region a-a, given by the terms (b) and (c) of (21), relative to the contribution of the aperture a-a is seen to be in the ratio of a/ A . The terms (a) and (b) indicate how the diffraction pattern of the free aperture will be modified by the geometrical extent of the region a-a. The term (c), while also tending to modify the free-aperture diffraction pattern, is primarily the diffraction pattern of a free aperture a-a shifted in the Y plane by an amount y/f = $/a. This term contributes largely to the structure of the image of a-a in the Z plane. One criterion for the maximum width of light source is that the geometrical image of the light source in plane